Opportunity Overview
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.
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| Issuing agency | Fraunhofer-Gesellschaft, Einkauf B12 |
|---|---|
| Country | Germany |
| Category | Cybersecurity |
| Published | September 17, 2026 |
| Procurement stage | Active solicitation |
| Closed | September 29, 2026 |
| Status | Closed — no longer accepting responses |
| Official source | View original notice |
| Last verified | October 10, 2026 |
Source: Tenders Electronic Daily (TED), © European Union. Notice content reused under Commission Decision 2011/833/EU; editorial content licensed CC BY 4.0. GlobalGov is not affiliated with the European Union.
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