Finland – Laboratory, optical and precision equipments (excl. glasses)

Electrochemical atomic force microscopy device: 1) non-resonant sinusoidal-oscillating imaging mode (nroIM): a. Pure vertical z-modulation of the cantilever; amplitudes (from < 1 nm to > 250 nm) and frequencies (from 125 Hz up to 2 kHz) freely selectable. b. In each contacting cycle, a direct determination of the maximum contact force (force setpoint) takes place in real time, where upon all control parameters are automatically and continuously optimized. Force setpoint minimum down to 10 pN. Stable imaging also for "negative force setpoints", i.e., below the baseline of the free force curve. c. Effective line rate >= 2 Hz at 512 pixel/line for all force setpoints possible. d. Suited for cantilevers with spring constants from < 0.001 N/m to > 500 N/m. e. Topography, DMT modulus, adhesion, energy dissipation, force setpoint error and deformation are measured and displayed simultaneously (location and time) and in real time. f. Lateral resolution down to atomic defects in lattice is possible. g. The tip-sample force interaction is continuously displayed in real time during the imaging process. h. This mode can be operated without any limitation of functionality with liquid cells, heating cells, EC cell, etc. The change of deflection signal due to cantilever drift is automatically and continuously eliminated (drift, e.g., induced by change of temperature or other environmental conditions). 2) System should be temperature controlled to minimize thermal drift: sensor in scanner and bridge with feedback loop to have scanner + bridge at similar temperature. Availability to heat from ambient to 35 deg. C. 3) System must be: a. Low-z-noise (< / = 40 pm RMS) atomic force microscope (AFM) with closed-loop tip-scanner (in all 3 axes) >= 85 um x 85 um x 9.5 um XYZ. b. Large sample space, capable to integrate heavy (> 5 kg) additional components (e.g., Nanoprober, customized sample holders, external magnetic fields). c. Motorized 150 mm x 150 mm sample stage. d. Extensive set of...